Download PDF by Sharon Rosenberg, Kathleen Meade: A Practical Guide to Adopting the Universal Verification

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By Sharon Rosenberg, Kathleen Meade

ISBN-10: 057805955X

ISBN-13: 9780578059556

With either cookbook-style examples and in-depth verification heritage, amateur and professional verification engineers will locate details to ease their adoption of this rising Accellera common.

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In addition, the use of films – and, in particular, structured films – means that imaging or diagnostic systems can be created. Just like a digital camera consists of an array of lightsensitive elements, so does a thermal imaging camera. Unlike piezoelectric systems, pyroelectric materials are operated using just one mode; the same as that used for piezoelectric thickness mode with the electrodes perpendicular to the poling direction. 2 Pyroelectric energy harvester While the pyroelectric effect can be used to harvest energy from temperature fluctuations, such fluctuations are not of significant magnitude or frequency to enable significant levels of energy to be captured (pW).

The source of material is either the surface of the grain, the grain boundary, or the lattice of the grains. Only material transported from the grain boundary or lattice of the grain will result in densification. 42 CHAPTER 2 Routes to thick films boundary diffusion, the rate scales as a function of 1/R4. In reality, all diffusion mechanisms are active but for large grain systems at high temperatures the dominant diffusion mechanism tends to be bulk diffusion, while for small grains at low or moderate temperatures, the dominant mechanism tends to be a mixed surface–boundary diffusion mechanism.

Hence, acoustic impedance is mainly controlled by adjusting the dimensions of the diaphragm. Bending-mode diaphragm structures can be engineered to have a range of acoustic impedances but are best suited for air applications and occasionally, water applications. Complicating the matter further, for both thickness- and bending-mode devices, the sensitivity of microphones increases significantly at the resonant frequency of the device. The resonant frequency of the device is also dictated by the material properties and dimensions of the device.

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A Practical Guide to Adopting the Universal Verification Methodology (UVM) by Sharon Rosenberg, Kathleen Meade

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